Focused Ion Beam Scanning Electron Microscope
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Scanning Electron Microscope -> Focused Ion Beam Scanning Electron Microscope
Focused Ion Beam Scanning Electron Microscope Definition
An instrument that combines the use of a focused beam of gallium ions to etch or coat a sample with a scanning electron microscope to image the sample.
Focused Ion Beam Scanning Electron Microscope Synonyms
Focused Ion Beam-Scanning Electron Microscope, FIB-SEM, FIB/SEM
Terms in Focused Ion Beam Scanning Electron Microscope category
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